How much the component life will be extended can be quantitatively measured using an ALT test to find the life-stress model. Derating is the process of reducing the load (typically voltage or current) on a component below its “rated” load, or equivlently selecting a component that is rated above the design load. The electronics manufacturer can collect failure data at a variety of stresses, fit the appropriate life-stress model, and then enter the “use stress” into the life-stress model to determine the failure distribution that is expected to occur at the use stress.ĪLT testing is also a very useful way to determine the effectiveness of derating. Done correctly, this is equivalent to speeding up the passage of time. By increasing the stress on the component, failure will be induced more rapidly. If the component being tested has a mean life of 30 years, the manufacturer cannot reasonably spend several years performing a reliability test as they are ready to release their product on the market soon. ALT is often used when we can not afford to wait for failures to occur at their normal rate but we need to know how failures are likely to occur in the future.Ĭonsider an electronics manufacturer who wants to know how many failures will occur in 10 years (possibly for warranty purposes). ALT is a popular method of testing because of its ability to “speed up time”.
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